I have an Samsung SSD 830 which reports errors when attaching to the system:
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[ 3723.017906] ata4.00: configured for UDMA/133
[ 3723.017923] ata4: EH complete
[ 3723.048574] ata4.00: exception Emask 0x0 SAct 0x0 SErr 0x0 action 0x0
[ 3723.048581] ata4.00: irq_stat 0x40000001
[ 3723.048586] ata4.00: failed command: READ DMA
[ 3723.048597] ata4.00: cmd c8/00:08:00:c2:e7/00:00:00:00:00/ee tag 3 dma 4096 in
res 51/04:08:00:c2:e7/00:00:00:00:00/ee Emask 0x1 (device error)
[ 3723.048602] ata4.00: status: { DRDY ERR }
[ 3723.048606] ata4.00: error: { ABRT }
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sudo smartctl -a /dev/sda
smartctl 7.1 2019-12-30 r5022 [x86_64-linux-5.4.0-72-generic] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Samsung based SSDs
Device Model: SAMSUNG SSD 830 Series
Serial Number: S0WJNYABC03229
LU WWN Device Id: 5 002538 043584d30
Firmware Version: CXM03B1Q
User Capacity: 128.035.676.160 bytes [128 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2 T13/2015-D revision 2
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Wed May 5 17:58:43 2021 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x02) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 540) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 9) minutes.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0
9 Power_On_Hours 0x0032 099 099 000 Old_age Always - 4267
12 Power_Cycle_Count 0x0032 097 097 000 Old_age Always - 2379
177 Wear_Leveling_Count 0x0013 097 097 000 Pre-fail Always - 84
179 Used_Rsvd_Blk_Cnt_Tot 0x0013 100 100 010 Pre-fail Always - 0
181 Program_Fail_Cnt_Total 0x0032 100 100 010 Old_age Always - 0
182 Erase_Fail_Count_Total 0x0032 100 100 010 Old_age Always - 0
183 Runtime_Bad_Block 0x0013 100 100 010 Pre-fail Always - 0
187 Uncorrectable_Error_Cnt 0x0032 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0032 072 054 000 Old_age Always - 28
195 ECC_Error_Rate 0x001a 200 200 000 Old_age Always - 0
199 CRC_Error_Count 0x003e 253 253 000 Old_age Always - 0
235 POR_Recovery_Count 0x0012 099 099 000 Old_age Always - 197
241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 12368831456
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Extended offline Completed without error 00% 4265 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.